Tailoring of domain wall devices for sensing applications

Hector Corte-Leon, Patryk Krzysteczko, Hans Werner Schumacher, Alessandra Manzin, Vladimir Antonov, Olga Kazakova

Результат исследований: Вклад в журналСтатьярецензирование

3 Цитирования (Scopus)


We perform magnetoresistance (MR) measurements to experimentally track magnetic domain wall pinning/depinning process in L-shaped Permalloy (Py) nanostructures with widths in the range 50-400 nm. We demonstrate that the field interval between the pinning/depinning events increases with the reduction of the nanowire width. The most reproducible measurements are obtained from the narrowest devices. MR measurements reveal that the stochastic contribution to pinning/depinning processes is higher when the applied field is oriented symmetrically with respect to both arms of the device. The interpretation of experimental results is supported by micromagnetic simulations.

Язык оригиналаАнглийский
Номер статьи2327803
ЖурналIEEE Transactions on Magnetics
Номер выпуска11
СостояниеОпубликовано - 1 нояб. 2014
Опубликовано для внешнего пользованияДа


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