Multi-beam engineering microscopy - A versatile tool for optimal materials design

Alexander M. Korsunsky, Tan Sui, Jiří Dluhoš, Siqi Ying, Alexander J.G. Lunt, Bohang Song, Enrico Salvati, Hongjia Zhang, Taehoon Kim, Sergei M. Kreynin

Результат исследований: Глава в книге, отчете, сборнике статейМатериалы для конференциирецензирование

1 Цитирования (Scopus)


Engineering microscopy is a term we use to refer to a suite of versatile techniques for spatially resolved characterisation of material structure and properties for the purpose of optimising design, performance and durability of structures and technological systems. The range of tools that can be used for this purpose includes beams of photons (including X-rays), electrons, neutrons, and ions. Different modes of imaging include absorption and emission, spectroscopy, and scattering that can be used in full field or scanning regimes. The approaches that collect information in the form of 2D images can also be extended to 3D characterisation by serial sectioning or reconstruction tomography. An important additional mode of near-surface property evaluation arises through the use of nanoscale contact tip sensors, such as AFM, nanoindentation, electrochemical probes, etc. Crucial underpinning for multi-beam microscopic characterization is provided by multi-scale materials modelling. The lecture will provide an overview of flavours of engineering microscopy and highlight the exciting opportunities presented by the combination of techniques in the form of so-called correlative microscopy. Examples of multi-modal correlative microscopy will include partially stabilized zirconia, biomaterials such as flax fibres and human dental tissues, and also advanced engineering alloys and ceramics″.

Язык оригиналаАнглийский
Название основной публикацииIMECS 2015 - International MultiConference of Engineers and Computer Scientists 2015
РедакторыDavid Dagan Feng, S. I. Ao, Craig Douglas, S. I. Ao, Craig Douglas, Jeong-A Lee, S. I. Ao, Oscar Castillo
ИздательNewswood Limited
Число страниц4
ISBN (электронное издание)9789881925398
СостояниеОпубликовано - 2015
Опубликовано для внешнего пользованияДа
СобытиеInternational MultiConference of Engineers and Computer Scientists 2015, IMECS 2015 - Tsimshatsui, Kowloon, Гонконг
Продолжительность: 18 мар. 201520 мар. 2015

Серия публикаций

НазваниеLecture Notes in Engineering and Computer Science
ISSN (печатное издание)2078-0958


КонференцияInternational MultiConference of Engineers and Computer Scientists 2015, IMECS 2015
ГородTsimshatsui, Kowloon


Подробные сведения о темах исследования «Multi-beam engineering microscopy - A versatile tool for optimal materials design». Вместе они формируют уникальный семантический отпечаток (fingerprint).