Microvisualization of structural features and ion electroinsertion behavior of patterned WO3 thin films via integrated optical and atomic force microscopies

Keith J. Stevenson, Joseph T. Hupp

Результат исследований: Вклад в журналСтатьярецензирование

14 Цитирования (Scopus)

Аннотация

A versatile method for preparing templated WO3 thin films on transparent, conductive indium tin oxide (ITO) is demonstrated. In addition, the patterned thin films serve as quantitative experimental platforms for the study of interfacial ion transfer reactions. The differential electroinsertion/electrochromic activity can be correlated with structural characteristics of patterned WO3 thin films. The influence of structural features such as film morphology, crystallinity and film thickness on the kinetic and optical electroinsertion behavior of redox-active metal oxides, specifically for MoO3, using integrated `microvisualization' approach is presented.

Язык оригиналаАнглийский
Страницы (с-по)497-500
Число страниц4
ЖурналElectrochemical and Solid-State Letters
Том2
Номер выпуска10
DOI
СостояниеОпубликовано - окт. 1999
Опубликовано для внешнего пользованияДа

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