Depth resolution of piezoresponse force microscopy

Florian Johann, Yongjun J. Ying, Tobias Jungk, Ákos Hoffmann, Collin L. Sones, Robert W. Eason, Sakellaris Mailis, Elisabeth Soergel

Результат исследований: Вклад в журналСтатьярецензирование

34 Цитирования (Scopus)

Аннотация

Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.

Язык оригиналаАнглийский
Номер статьи172904
ЖурналApplied Physics Letters
Том94
Номер выпуска17
DOI
СостояниеОпубликовано - 2009
Опубликовано для внешнего пользованияДа

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