The resolution obtained from low energy ion scattering using an ion cyclotron resonance spectrometer

E. N. Nikolaev, V. E. Frankevich, W. Aberth

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The resolving power of the low energy ion scattering technique with FT-ICR spectrometry is discussed. Resolution improvement due to simultaneous registration of scattered ions with different masses is shown.

Original languageEnglish
Pages (from-to)9-14
Number of pages6
JournalInternational Journal of Mass Spectrometry and Ion Processes
Volume130
Issue number1-2
DOIs
Publication statusPublished - 6 Jan 1994
Externally publishedYes

Keywords

  • External ion source
  • Fourier transform ion cyclotron resonance
  • Ion scattering
  • Surface analysis

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