The resolving power of the low energy ion scattering technique with FT-ICR spectrometry is discussed. Resolution improvement due to simultaneous registration of scattered ions with different masses is shown.
|Number of pages||6|
|Journal||International Journal of Mass Spectrometry and Ion Processes|
|Publication status||Published - 6 Jan 1994|
- External ion source
- Fourier transform ion cyclotron resonance
- Ion scattering
- Surface analysis