The realization of a low‐energy ion‐scattering technique with an ion cyclotron resonance spectrometer

E. N. Nikolaev, A. V. Mordehai, V. E. Frankevich

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

A low energy ion scattering technique for investigation of the first monolayer of a surface has been realized in an ion cyclotron resonance mass spectrometer. The secondary‐ion mass spectrometry mode is also available in the same configuration. Preliminary results are shown for the analysis of the metal surface of a magneto‐optical recording film.

Original languageEnglish
Pages (from-to)260-262
Number of pages3
JournalRapid Communications in Mass Spectrometry
Volume5
Issue number6
DOIs
Publication statusPublished - Jun 1991
Externally publishedYes

Fingerprint

Dive into the research topics of 'The realization of a low‐energy ion‐scattering technique with an ion cyclotron resonance spectrometer'. Together they form a unique fingerprint.

Cite this