Synergy between transmission electron microscopy and powder diffraction: Application to modulated structures

Dmitry Batuk, Maria Batuk, Artem M. Abakumov, Joke Hadermann

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

The crystal structure solution of modulated compounds is often very challenging, even using the well established methodology of single-crystal X-ray crystallography. This task becomes even more difficult for materials that cannot be prepared in a single-crystal form, so that only polycrystalline powders are available. This paper illustrates that the combined application of transmission electron microscopy (TEM) and powder diffraction is a possible solution to the problem. Using examples of anion-deficient perovskites modulated by periodic crystallographic shear planes, it is demonstrated what kind of local structural information can be obtained using various TEM techniques and how this information can be implemented in the crystal structure refinement against the powder diffraction data. The following TEM methods are discussed: electron diffraction (selected area electron diffraction, precession electron diffraction), imaging (conventional high-resolution TEM imaging, high-angle annular dark-field and annular bright-field scanning transmission electron microscopy) and state-of-the-art spectroscopic techniques (atomic resolution mapping using energy-dispersive X-ray analysis and electron energy loss spectroscopy).

Original languageEnglish
Pages (from-to)127-143
Number of pages17
JournalActa Crystallographica Section B: Structural Science, Crystal Engineering and Materials
Volume71
DOIs
Publication statusPublished - 1 Apr 2015
Externally publishedYes

Keywords

  • anion-deficient perovskites
  • modulated structures
  • powder diffraction
  • transmission electron microscopy

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