Synchrotron XRD study of residual stress in a shot peened Al/SiC pcomposite

Fabio Rotundo, Alexander M. Korsunsky

Research output: Contribution to journalConference articlepeer-review

10 Citations (Scopus)

Abstract

In the present study, residual strain profiles in shot peened specimens of 2124-T4 aluminium alloy matrix composite reinforced with 17vol% particulate silicon carbide (SiCp) were measured by means of synchrotron-based diffraction using monochromatic, high energy X-ray beams. The stress state was considered in relation with the microstructural and morphological modifications induced in the material by shot peening. Strain-induced changes in the lattice parameters were deduced from diffraction measurements made by two detectors mounted in the horizontal and vertical diffraction planes, providing information on lattice strains in two nearly mutually perpendicular in-plane directions. On the basis of these data, residual strain and stress profiles through the specimen thickness were reconstructed for both phases (silicon carbide and aluminium alloy). Microstructural characterization was performed by means of optical and scanning electron microscopy (SEM), and particle distribution and hardness modification were identified. The effect of shot peening on the reinforcement and matrix stress states was evaluated. The findings are discussed in the context of process optimization for fatigue resistance improvement in aluminium alloy-based MMCs.

Original languageEnglish
Pages (from-to)221-224
Number of pages4
JournalProcedia Engineering
Volume1
Issue number1
DOIs
Publication statusPublished - 2009
Externally publishedYes
EventMesomechanics 2009 - Oxford, United Kingdom
Duration: 24 Jun 200926 Jun 2009

Keywords

  • MMC
  • Residual stress
  • Shot peening
  • X-rays diffraction

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