Synchrotron investigations of nonuniformly shaped shot-peened samples

A. M. Venter, C. P. La Grange, F. Hofmann, T. S. Jun, J. Belnoue, P. R. Van Heerden, A. Evans, A. M. Korsunsky

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

We report results from X-ray synchrotron residual strain investigations of conically shaped 17-4PH stainless steel samples treated to different shot-peen intensities. The residual strains are compared to the as-manufactured condition as well as a sample coldwater quenched. The magnitudes of the induced residual strains in the shot-peened samples are in relation to the peen intensities. Investigations on slices cut from the bulk samples indicate a underlying material thickness dependence.

Original languageEnglish
Pages (from-to)315-320
Number of pages6
JournalZeitschrift fur Kristallographie, Supplement
Issue number30
DOIs
Publication statusPublished - 2009
Externally publishedYes

Keywords

  • Residual strain
  • Shot peening
  • X-ray synchrotron diffraction

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