Spectral Fourier-microscopy of the periodic structures based on Ge2Sb2Te5

A. I. Solomonov, S. I. Pavlov, P. I. Lazarenko, V. V. Kovalyuk, A. D. Golikov, A. I. Prokhodtsov, G. N. Goltsman, S. A. Kozyukhin, S. A. Dyakov, N. A. Gippius, S. G. Tikhodeev, A. B. Pevtsov

Research output: Contribution to journalConference articlepeer-review


The method of spectral Fourier microscopy was used to study the reflection spectra with an angular resolution of submicron periodic gratings based on amorphous and crystalline Ge2Sb2Te5. The form of the dispersion curves of quasi-waveguide modes in the structures under study was established. The experimental data were compared with the calculations of dispersion curves in synthesized diffraction gratings. Reasonable agreement between theoretical and experimental data was obtained.

Original languageEnglish
Article number012173
JournalJournal of Physics: Conference Series
Issue number1
Publication statusPublished - 14 Dec 2021
EventInternational Conference PhysicA.SPb/2021 - Saint Petersburg, Russian Federation
Duration: 18 Oct 202122 Oct 2021


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