Sn2-2xSbxFexO4 solid solutions as possible inert anode materials in aluminum electrolysis

V. A. Govorov, A. M. Abakumov, M. G. Rozova, A. G. Borzenko, S. Yu Vassiliev, V. M. Mazin, M. I. Afanasov, P. B. Fabritchnyi, G. A. Tsirlina, E. V. Antipov, E. N. Morozova, A. A. Gippius, V. V. Ivanov, G. Van Tendeloo

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12 Citations (Scopus)


Single-phase samples of the Sn2-2xSbxFe xO4 solid solution were prepared by solid-state reaction in air at 1300°C for 0.26 ≤ x ≤ 0.66. The crystal structure of the Sn2-2xSbxFexO4 phases was studied by electron diffraction and X-ray powder diffraction. The compounds crystallize with the rutile type structure with a disordered arrangement of cations (P4 2/mnm space group, a = 4.7127(6) Å, c = 3.1595(4) Å, RI = 0.020, Rp = 0.019 for Sn1.48Sb 0.26Fe0.26O4 and a = 4.6682(8) Å, c = 3.1147(6) Å, RI = 0.030, RP = 0.022 for Sn 0.68Sb0.66Fe0.66O4). The valence state of cations in the Sn1.48Sb0.26Fe 0.26O4 and Sn0.68Sb0.66Fe 0.66O4 samples was determined by means of 119Sn, 121Sb, and 57Fe Mössbauer spectroscopy. The presence of Sn(II), Sb(III), or Fe(II) low valent state species was not detected in the samples. Resistivity vs temperature measurements revealed a semiconducting behavior from room temperature up to 900°C with about four orders in magnitude decrease of the resistivity. Solubility tests in the cryolite-alumina melt showed that the steady-state concentration of dissolved tin for the samples with x = 0.26, 0.36 is significantly lower than that for SnO2. The electrocatalytic activity and solid degradation products of Sn2-2xSbxFexO4 are compared with those of another possible anode material (SnO2 with small amount of the CuO and Sb2O3 additives). These tests allow evaluation of the prospects of the Sn2-2xSbxFe xO4 solid solutions as inert anode materials and to formulate an approach to further improvement of their degradation stability.

Original languageEnglish
Pages (from-to)3004-3011
Number of pages8
JournalChemistry of Materials
Issue number11
Publication statusPublished - 31 May 2005
Externally publishedYes


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