Removal of ocular artifacts for high resolution EEG studies: A simulation study

Laura Astolfi, Febo Cincotti, Donatella Mattia, Fabio Babiloni, Maria Grazia Marciani, Fabrizio De Vico Fallani, Marco Mattiocco, Fumikazu Miwakeichi, Yoko Yamaguchi, Pablo Martinez, Serenella Salinari, Andrea Tocci, Hovagim Bakardjian, Francois Benoit Vialatte, Andrzej Cichocki

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

Eye movements and blinks may produce unusual voltage changes that propagates from the eyeball through the head as volume conductor up to the scalp electrodes, generating severe electroencephalographic artifacts. Several methods are now available to correct the distortion Induced by these events on the EEG, having different advantages and drawbacks. The main focus of this work is to quantify the performance of the removal of EOG artifact due to the application of the independent component analysis (ICA) methodology. The precise quantification of the effects of artifact removal by ICA is possible by using a simulation setup, with a realistic head model, that it is able to mimic the occurrence of an eye blink. The electrical activity generated by the simulated eyeblink were propagated through the realistic head model and superimposed to a clean segment of EEG. Then, artifact removal was performed by using the ICA approach. Ocular artifact removal was evaluated in different operative conditions, characterized by different Signal to Noise Ratio and number of electrodes. The error measures used were the Relative Error and the Correlation Coefficient between the clear, original EEG segment and those obtained after the application of the ICA procedure.

Original languageEnglish
Title of host publication28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06
Pages976-979
Number of pages4
DOIs
Publication statusPublished - 2006
Externally publishedYes
Event28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06 - New York, NY, United States
Duration: 30 Aug 20063 Sep 2006

Publication series

NameAnnual International Conference of the IEEE Engineering in Medicine and Biology - Proceedings
ISSN (Print)0589-1019

Conference

Conference28th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS'06
Country/TerritoryUnited States
CityNew York, NY
Period30/08/063/09/06

Keywords

  • EEG
  • EOG
  • High resolution EEG
  • ICA
  • Realistic head model

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