Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy

León Romano Brandt, Enrico Salvati, Chrysanthi Papadaki, Hongjia Zhang, Siqi Ying, Eric Le Bourhis, Igor Dolbnya, Tan Sui, Alexander M. Korsunsky

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

When thin metallic multilayers deposited on a compliant polymer substrate are subjected to stretching, a “brick wall” fracture pattern arises that is associated with a non-uniform two-dimensional stress-strain state evolving as a function of the underlying substrate stretch. The present study is devoted to in situ mechanical microscopy of strain states in a copper/tungsten 18/6 nm multilayer using the combination of synchrotron Scanning X-Ray Diffraction Microscopy (SXDM) and Scanning Electron Microscopy (SEM), coupled with Digital Image Correlation (DIC). We demonstrate that these methods allow spatial variation of the coating strain to be mapped and compared with theoretical predictions based on shear lag theory, allowing the fracture properties of the multilayer to be extracted.

Original languageEnglish
Pages (from-to)158-167
Number of pages10
JournalSurface and Coatings Technology
Volume320
DOIs
Publication statusPublished - 25 Jun 2017
Externally publishedYes

Keywords

  • In situ mechanical microscopy
  • In situ strain mapping
  • Nano-multilayer
  • Scanning X-ray Diffraction Microscopy (SXDM)
  • Shear lag model

Fingerprint

Dive into the research topics of 'Probing the deformation and fracture properties of Cu/W nano-multilayers by in situ SEM and synchrotron XRD strain microscopy'. Together they form a unique fingerprint.

Cite this