Polar Transformation of 2D X-ray Diffraction Patterns for 2D Strain Evaluation

Eugene S. Statnik, Alexei I. Salimon, Fatih Uzun, Alexander M. Korsunsky

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

High energy synchrotron X-ray diffraction is widely used for residual stress evaluation. Rapid and accurate conversion of 2D diffraction patterns to 1D intensity plots is an essential step used to prepare the data for subsequent analysis, particularly strain evaluation. The conventional multi-step conversion process based on radial binning of diffraction patterns ('caking') is somewhat time consuming. A new method is proposed here that relies on the direct 'polar transformation' of 2D X-ray diffraction patterns. As an example of using this approach, residual strain values in an Al alloy bar containing a Friction Stir Weld (FSW) and subjected to in situ bending were calculated by using both 'polar transformation' and 'caking'. The results by the new approach show good agreement with 'caking' microstrain evaluation. However, the 'polar transformation' technique simplifies the analysis process by skipping 2D to 1D conversion and opens new possibilities for robust 2D diffraction data analysis for strain evaluation.

Original languageEnglish
Title of host publicationProceedings of the World Congress on Engineering 2019, WCE 2019
EditorsS. I. Ao, Len Gelman, David WL Hukins, Andrew Hunter, A. M. Korsunsky
PublisherNewswood Limited
Pages397-401
Number of pages5
ISBN (Electronic)9789881404862
Publication statusPublished - 2019
Event2019 World Congress on Engineering, WCE 2019 - London, United Kingdom
Duration: 3 Jul 20195 Jul 2019

Publication series

NameLecture Notes in Engineering and Computer Science
Volume2240
ISSN (Print)2078-0958
ISSN (Electronic)2078-0966

Conference

Conference2019 World Congress on Engineering, WCE 2019
Country/TerritoryUnited Kingdom
CityLondon
Period3/07/195/07/19

Keywords

  • Polar transformation
  • Residual stress
  • Synchrotron X-ray diffraction

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