Polar transformation of 2D X-ray diffraction patterns and the experimental validation of the hDIC technique

Fatih Uzun, Alexey I. Salimon, Eugene S. Statnik, Cyril Besnard, Jingwei Chen, Thomas Moxham, Enrico Salvati, Zifan Wang, Alexander M. Korsunsky

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


Deformation analysis in engineering materials and components is a subject of ongoing enquiry due to its importance for obtaining reliable prediction of strength and durability of structures and assemblies. Whilst optical methods deliver information about surface displacements, X-ray scattering methods have the capability to provide efficient assessment of crystal lattice distortion in the bulk of the component. The height digital image correlation (hDIC) technique is an alternative to conventional digital image correlation that uses the out-of-plane surface height variations for the identification of triaxial deformations. In this study, the hDIC technique was used for the determination of displacements in an aluminium specimen after 3-point bending process that creates a complex deformation state that includes both axial displacements and rotations. The surface of the specimen was prepared for the analysis by electric discharge machining (EDM) technique that has minimal effect on material properties and produces random height profile well-suited for the aim of this study. Surface height variations were measured using deep focus microscopy and used instead of pixel intensity for correlation in the DIC process. The distribution of total of elastic and plastic strains were also calculated by the evolutionary eigenstrain model using 2D X-ray diffraction patterns processed according to the polar transformation method. The agreement between hDIC and polar X-Ray diffraction analyses allowed reliable cross-validation between these two techniques.

Original languageEnglish
Article number107193
JournalMeasurement: Journal of the International Measurement Confederation
Publication statusPublished - Feb 2020


  • Deep focus microscopy
  • Evolutionary eigenstrain model
  • Polar transformation
  • The hDIC technique
  • X-ray diffraction


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