Photo- and electroreflectance spectra from spatially inhomogeneous heterostructures calculated by means of a new method

D. Beliaev, R. Enderlein, J. A.N.T. Soares, L. M.R. Scolfaro, A. Marti Ceschin, A. A. Quivy, J. R. Leite

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

The problem of calculating photo- and electro-reflectance spectra from weakly inhomogeneous layers of semiconductor heterostructures is solved by combining two former approaches; the transfer matrix method and the perturbation theoretical treatment of the weak inhomogeneity. The electric field profile and its perturbation by pump light is calculated from an integral equation. The method is applied to several heterostructures based on (Ga, Al)As. Due to its speed and accuracy the method is capable of online simulation of PR and ER spectra.

Original languageEnglish
Pages (from-to)339-343
Number of pages5
JournalSuperlattices and Microstructures
Volume15
Issue number3
DOIs
Publication statusPublished - Apr 1994
Externally publishedYes

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