Permanent holographic recording in indium oxide thin films using 193 nm excimer laser radiation

S. Pissadakis, S. Mailis, L. Reekie, J. S. Wilkinson, R. W. Eason, N. A. Vainos, K. Moschovis, G. Kiriakidis

Research output: Contribution to journalArticlepeer-review

22 Citations (Scopus)

Abstract

Permanent holographic recording in sputtered indium oxide (InOx) thin films is demonstrated, using ultraviolet radiation at 193 nm emitted by an ArF excimer laser. Steady-state refractive index changes of up to 5×10-3 are calculated from the measured diffraction efficiency of a HeNe laser probe beam. The recorded gratings exhibit a dynamic behaviour that relaxes to a steady-state value that depends on the oxygen partial pressure used during growth and on the recording beam intensity. The observed behaviour is explained in terms of laser-induced structural changes.

Original languageEnglish
Pages (from-to)333-336
Number of pages4
JournalApplied Physics A: Materials Science and Processing
Volume69
Issue number3
DOIs
Publication statusPublished - Sep 1999
Externally publishedYes

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