Oxford HEXameter: Laboratory high energy X-ray diffractometer for bulk residual stress analysis

Alexander M. Korsunsky, Shu Yan Zhang, Daniele Dini, Willem J.J. Vorster, Jian Liu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Citations (Scopus)

Abstract

Diffraction of penetrating radiation such as neutrons or high energy X-rays provides a powerful non-destructive method for the evaluation of residual stresses in engineering components. In particular, strain scanning using synchrotron energy-dispersive X-ray diffraction has been shown to offer a fast and highly spatially resolving measurement technique. Synchrotron beamlines provide best available instruments in terms of flux and low beam divergence, and hence spatial and measurement resolution and data collection rate. However, despite the rapidly growing number of facilities becoming available in Europe and across the world, access to synchrotron beamlines for routine industrial and research use remains regulated, comparatively slow and expensive. A laboratory high energy X-ray diffractometer for bulk residual strain evaluation (HEXameter) has been developed and built at Oxford University. It uses a twin-detector setup first proposed by one of the authors in the energy dispersive X-ray diffraction mode and allows simultaneous determination of macroscopic and microscopic strains in two mutually orthogonal directions that lie approximately within the plane normal to the incident beam. A careful procedure for detector response calibration is used in order to facilitate accurate determination of lattice parameters by pattern refinement. The results of HEXameter measurements are compared with synchrotron X-ray data for several samples e.g. made from a titanium alloy and a particulate composite with an aluminium alloy matrix. Experimental results are found to be consistent with synchrotron measurements and strain resolution close to 2× 10-4 is routinely achieved by the new instrument.

Original languageEnglish
Title of host publicationResidual Stresses VII - Proceedings of the 7th European Conference on Residual Stresses, ECRS 7
EditorsWalter Reimers, S. Quander
PublisherTrans Tech Publications Ltd
Pages743-748
Number of pages6
ISBN (Print)9780878494149
DOIs
Publication statusPublished - 2006
Externally publishedYes
Event7th European Conference on Residual Stresses, ECRS 7 - Berlin, Germany
Duration: 13 Sep 200615 Sep 2006

Publication series

NameMaterials Science Forum
Volume524-525
ISSN (Print)0255-5476
ISSN (Electronic)1662-9752

Conference

Conference7th European Conference on Residual Stresses, ECRS 7
Country/TerritoryGermany
CityBerlin
Period13/09/0615/09/06

Keywords

  • Energy-dispersive X-ray diffraction
  • Laboratory X-ray diffraction
  • Lattice parameter
  • Strain
  • Stress analysis

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