Engineering microscopy is a term we use to refer to a suite of versatile techniques for spatially resolved characterisation of material structure and properties for the purpose of optimising design, performance and durability of structures and technological systems. The range of tools that can be used for this purpose includes beams of photons (including X-rays), electrons, neutrons, and ions. Different modes of imaging include absorption and emission, spectroscopy, and scattering that can be used in full field or scanning regimes. The approaches that collect information in the form of 2D images can also be extended to 3D characterisation by serial sectioning or reconstruction tomography. An important additional mode of near-surface property evaluation arises through the use of nanoscale contact tip sensors, such as AFM, nanoindentation, electrochemical probes, etc. Crucial underpinning for multi-beam microscopic characterization is provided by multi-scale materials modelling. The lecture will provide an overview of flavours of engineering microscopy and highlight the exciting opportunities presented by the combination of techniques in the form of so-called correlative microscopy. Examples of multi-modal correlative microscopy will include partially stabilized zirconia, biomaterials such as flax fibres and human dental tissues, and also advanced engineering alloys and ceramics″.