Microvisualization of structural features and ion electroinsertion behavior of patterned WO3 thin films via integrated optical and atomic force microscopies

Keith J. Stevenson, Joseph T. Hupp

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Microvisualization of structural features and ion electroinsertion behavior of patterned WO3 thin films via integrated optical and atomic force microscopies'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds