Magnetic scanning gate microscopy of a domain wall nanosensor using microparticle probe

H. Corte-León, B. Gribkov, P. Krzysteczko, F. Marchi, J. F. Motte, H. W. Schumacher, V. Antonov, O. Kazakova

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

We apply the magnetic scanning gate microscopy (SGM) technique to study the interaction between a magnetic bead (MB) and a domain wall (DW) trapped in an L-shaped magnetic nanostructure. Magnetic SGM is performed using a custom-made probe, comprising a hard magnetic NdFeB bead of diameter 1.6 μm attached to a standard silicon tip. The MB-DW interaction is detected by measuring changes in the electrical resistance of the device as a function of the tip position. By scanning at different heights, we create a 3D map of the MB-DW interaction and extract the sensing volume for different widths of the nanostructure's arms. It is shown that for 50 nm wide devices the sensing volume is a cone of 880 nm in diameter by 1.4 μm in height, and reduces down to 800 nm in height for 100 nm devices with almost no change in its diameter.

Original languageEnglish
Pages (from-to)225-229
Number of pages5
JournalJournal of Magnetism and Magnetic Materials
Volume400
DOIs
Publication statusPublished - 15 Feb 2016
Externally publishedYes

Keywords

  • AMR
  • Domain wall
  • Magnetic bead
  • MFM
  • Nanosensor
  • SGM

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