Low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer-scale objects: Application to carbon nanotubes

Pavel Dorozhkin, H. Nejoh, D. Fujita

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

A technique for two-terminal transport measurements of free standing wire-like objects was developed based on the low-energy electron point source microscope. The microscope's field emission tip was used as a movable electrode to make a well-defined local electrical contact on a controlled place of a nanometer-size object. The technique was applied to ropes of carbon nanotubes.

Original languageEnglish
Pages (from-to)1044-1047
Number of pages4
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume20
Issue number3
DOIs
Publication statusPublished - May 2002
Externally publishedYes

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