We demonstrate experimentally that linear polarization of porous Si photoluminescence depends significantly on the excitation geometry and describe this effect within the framework of a dielectric model in which porous Si is considered as an aggregate of slightly deformed, elongated and flattened, dielectric elliptical Si nanocrystals with preferred orientation in the  direction. The theoretical best-fit analysis of the experimental data allows us to get certain information concerning the shapes and orientation of the ellipsoids.
|Number of pages||6|
|Journal||Materials Research Society Symposium - Proceedings|
|Publication status||Published - 1996|
|Event||Proceedings of the 1995 MRS Fall Meeting - Boston, MA, USA|
Duration: 26 Nov 1995 → 1 Dec 1995