Intragranular lattice misorientation mapping by synchrotron x-ray micro-beams: Laue vs energy-resolved laue vs monochromatic reciprocal space analysis

Felix Hofmann, Brian Abbey, Xu Song, Igor Dolbnya, Alexander M. Korsunsky

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

Laue diffraction, energy scanning and reciprocal space mapping are three micro-beam synchrotron X-ray diffraction techniques allowing the investigation of local misorientation induced by the dislocation substructure. In this paper a comparison between the three methods is presented, based on the mapping of a single 311 reflection from a grain within a Ni polycrystal specimen deformed to a tensile plastic strain of ∼9%. Qualitatively it is observed that the maps obtained by different techniques all share the same features, although some deviations exist due to experimental limitations associated with each of the measurement techniques.

Original languageEnglish
Pages (from-to)279-287
Number of pages9
JournalInternational Journal of Modern Physics B
Volume24
Issue number1-2
DOIs
Publication statusPublished - 20 Jan 2010
Externally publishedYes

Keywords

  • Dislocation substructure
  • Micro-beam Laue diffraction
  • Reciprocal space mapping

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