Fast residual stress mapping using energy-dispersive synchrotron X-ray diffraction on station 16.3 at the SRS

Alexander M. Korsunsky, Steve P. Collins, R. Alexander Owen, Mark R. Daymond, Saïda Achtioui, Karen E. James

Research output: Contribution to journalArticlepeer-review

57 Citations (Scopus)

Abstract

Synchrotron energy-dispersive X-ray diffraction experiments on station 16.3 at the SRS for residual strain mapping are reported. A white beam with an energy-discriminating detector allows measurements to be made through 3 mm Al, Ti, Fe and Cu alloys with acquisition times of ∼30 s per 0.3 mm3 sampling volume. The collected profiles were analysed using single-peak fitting and whole-pattern Pawley refinement, and produced strain accuracy better than 10-4. This configuration is therefore highly efficient for fast strain mapping in thin components using a second-generation synchrotron source.

Original languageEnglish
Pages (from-to)77-81
Number of pages5
JournalJournal of Synchrotron Radiation
Volume9
Issue number2
DOIs
Publication statusPublished - 1 Mar 2002
Externally publishedYes

Keywords

  • Energy-dispersive X-ray diffraction
  • Residual stress

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