Depth resolution of piezoresponse force microscopy

Florian Johann, Yongjun J. Ying, Tobias Jungk, Ákos Hoffmann, Collin L. Sones, Robert W. Eason, Sakellaris Mailis, Elisabeth Soergel

Research output: Contribution to journalArticlepeer-review

33 Citations (Scopus)

Abstract

Given that a ferroelectric domain is generally a three dimensional entity, the determination of its area as well as its depth is mandatory for full characterization. Piezoresponse force microscopy (PFM) is known for its ability to map the lateral dimensions of ferroelectric domains with high accuracy. However, no depth profile information has been readily available so far. Here, we have used ferroelectric domains of known depth profile to determine the dependence of the PFM response on the depth of the domain, and thus effectively the depth resolution of PFM detection.

Original languageEnglish
Article number172904
JournalApplied Physics Letters
Volume94
Issue number17
DOIs
Publication statusPublished - 2009
Externally publishedYes

Fingerprint

Dive into the research topics of 'Depth resolution of piezoresponse force microscopy'. Together they form a unique fingerprint.

Cite this