Deep Learning for Postharvest Decay Prediction in Apples

Nikita Stasenko, Maxim Savinov, Valeriy Burlutskiy, Maria Pukalchik, Andrey Somov

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    Artificial Intelligence (AI) is a widely used tool in precision agriculture for estimating the quality of food. It is especially relevant while assessing crops at various harvest and postharvest stages. Crop disease and damage detection is a task of top priority: some postharvest diseases or damages, e.g. decay, may destroy the crops and create toxins harmful to human beings. In this work, we apply U-Net, Deeplab, and Mask R-CNN models based on Convolutional Neural Networks (CNNs) for detecting and predicting the postharvest decay areas in stored apple fruits. Novelty of our approach is separate segmentation and prediction of postharvest decay and non-decay areas in apples. Images were acquired with a custom-made testbed consisting of a digital camera, stepper drivers pallet for apples, and the PC. The dataset of the acquired time-sequenced images of the postharvest apples includes 4440 images and is available online. Mask R-CNN demonstrated the best performance and achieved 98.81% of the mean Average Precision (mAP) for apples and 43.60% of the mAP for postharvest decay zones. The proposed approach is promising for improving the food storage process in precision agriculture.

    Original languageEnglish
    Title of host publicationIECON 2021 - 47th Annual Conference of the IEEE Industrial Electronics Society
    PublisherIEEE Computer Society
    ISBN (Electronic)9781665435543
    DOIs
    Publication statusPublished - 13 Oct 2021
    Event47th Annual Conference of the IEEE Industrial Electronics Society, IECON 2021 - Toronto, Canada
    Duration: 13 Oct 202116 Oct 2021

    Publication series

    NameIECON Proceedings (Industrial Electronics Conference)
    Volume2021-October

    Conference

    Conference47th Annual Conference of the IEEE Industrial Electronics Society, IECON 2021
    Country/TerritoryCanada
    CityToronto
    Period13/10/2116/10/21

    Keywords

    • Artificial intelligence
    • deep learning
    • digital agriculture
    • postharvest decay
    • precision agriculture

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