Damage Threshold of Ni Thin Film by Terahertz Pulses

O. V. Chefonov, A. V. Ovchinnikov, S. A. Evlashin, M. B. Agranat

    Research output: Contribution to journalLetterpeer-review

    11 Citations (Scopus)

    Abstract

    Damage in a thin nickel film irradiated by subpicosecond pulses of terahertz (THz) radiation in the range of 1–3 THz at electric-field strengths up to 20 MV/cm at the center of a focal spot is observed. The damage threshold fluence is evaluated for single-pulse experiments. The damage pattern induced by multiple THz pulses has the appearance of a complex periodic structure in the form of elongated channels of metal film discontinuity that are perpendicular to the in-plane electric field direction of THz radiation.

    Original languageEnglish
    Pages (from-to)1047-1054
    Number of pages8
    JournalJournal of Infrared, Millimeter, and Terahertz Waves
    Volume39
    Issue number11
    DOIs
    Publication statusPublished - 1 Nov 2018

    Keywords

    • Damage threshold
    • Terahertz radiation
    • Thin films

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