Correction to: Ambient Condition Production of High Quality Reduced Graphene Oxide (Advanced Materials Interfaces, (2018), 5, 18, (1800737), 10.1002/admi.201800737)

Stanislav A. Evlashin, Sergey E. Svyakhovskiy, Fedor S. Fedorov, Yuri A. Mankelevich, Pavel V. Dyakonov, Nikita V. Minaev, Sarkis A. Dagesyan, Konstantin I. Maslakov, Roman A. Khmelnitsky, Nikolay V. Suetin, Iskander S. Akhatov, Albert G. Nasibulin

    Research output: Contribution to journalComment/debate

    Abstract

    Adv. Mater. Interfaces. 2018, 5, 1800737 The authors regret that Figure and Figure S2 published in this manuscript was incorrect, and did not represent the data that was analyzed and discussed. The correct and complete Figures and S2 now appear here. (Figure presented.) Raman and XPS spectra of GO and rGO. a, b) Raman spectrum of GO and rGO and c, d) XPS spectrum of GO and rGO. Figure S2. a) Raman spectra for the different sets of reduction conditions. b) XPS spectra of GO and rGO. c) XPS C1s for the different sets of reduction conditions. d) FTIR spectra for different sets of reduction conditions.

    Original languageEnglish
    Article number1801180
    JournalAdvanced Materials Interfaces
    Volume5
    Issue number19
    DOIs
    Publication statusPublished - 9 Oct 2018

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