Charge distribution mapping by low energy electrons

P. S. Dorozhkin, Z. C. Dong

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)


We demonstrate how low energy electron point source microscope can be used for quantitative mapping of linear charge distribution along one-dimensional wires. Imaging of electrically biased carbon nanotube ropes suspended across two electrodes showed different charge distributions for three different experimental situations: (1) ropes having good ohmic contacts to both electrodes, (2) ropes with one good and one poor ohmic contacts, and (3) ropes with one end contacted and the other end free standing. The technique gives a linear charge density resolution below 0.1 e per nanometer with a spatial resolution better than 10 nm. The resolution can be further improved by the proper modification of experimental setup.

Original languageEnglish
Pages (from-to)4490-4492
Number of pages3
JournalApplied Physics Letters
Issue number19
Publication statusPublished - 8 Nov 2004
Externally publishedYes


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