A review of recent in situ deformation studies using synchrotron X-ray (Micro) beams

Alexander M. Korsunsky, Felix Hofmann, Xu Song, Brian Abbey, Nikolaos Baimpas

Research output: Contribution to journalReview articlepeer-review

1 Citation (Scopus)

Abstract

The advent of (sub)microscopic focused X-ray beams at third generation synchrotron sources has opened up possibilities for the characterisation of material structure and mechanical behaviour with unprecedented spatial resolution. Crucially, the non-destructive nature and fast rate of X-ray data collection allow in situ deformation to be studied. In this review, we concentrate on the inelastic deformation response of ductile metallic (poly)crystals. We describe a range of diffraction-based techniques we have developed including monochromatic beam reciprocal space mapping, scanning "pink" beam micro-diffraction compound topography, and white beam Laue micro-diffraction. We compare the results obtained using each of the above techniques, and assess and review the insights that they afford into micro-scale material deformation.

Original languageEnglish
Pages (from-to)97-105
Number of pages9
JournalMicro and Nanosystems
Volume4
Issue number2
DOIs
Publication statusPublished - Jun 2012
Externally publishedYes

Keywords

  • Dislocation
  • Micro-beam
  • Synchrotron
  • X-ray diffraction

Fingerprint

Dive into the research topics of 'A review of recent in situ deformation studies using synchrotron X-ray (Micro) beams'. Together they form a unique fingerprint.

Cite this